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JEOL JSM- 6010PLUS/LA Analytical Scanning Electron Microscope (SEM) - We purchase SEM Microsocpes
Basic specifications are: Resolution: 4.0nm (at 20kV) Resolution in LV Mode: 5.0nm Magnification: 8X to 300,000X (5X possible) Accelerating Voltage: 500V to 20kV JSM-6010PLUS_LA Applications Inspection and analysis of impurities on the resin surface...
Manufacturer:JEOL
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